EM-4 Emissometer
EM-4 Emissometer
To measure the emissivity of any type of surface
For infrared radiation energy flux measurements, it is essential to know the emissivity value
Emissivity is a parameter that influences the thermal radiation of a surface. This parameter can undergo multiple variations due to the environment.
It is therefore necessary to have a device capable of making measurements in situ.
We tailor EM4 to your needs
Measurement of total emissivity by reflectometric method.
Emissometre EM4
The modulated flux method is independent of the temperature of the sample. A sample can be measured outdoors regardless of its temperature. Patented device (FR1251476)
The emissometer allows these users to:
- Measuring total directional emissivity
- Calculate the total hemispheric emissivity
- Evaluate the specular or scattering character of the surface
The device can measure high and low emissivity.
As an option, emissivity can be measured in specific bands (e.g. 8-12μm).
Supplied with power supply,
4 reference surfaces and carrying case
Our team advises you to best meet your expectations