EM-5 Emissometer
EM-5 Emissometer
For measuring the emissivity of all kind of surfaces in the laboratory or in the field
For infrared radiation energy flux measurements, it is essential to know the emissivity value
Emissivity is a parameter which influences the thermal radiation of a surface.
This characteristic of the surface of the materials is therefore generally known in the literature for a large number of materials.
However, this parameter can undergo multiple variations due to the environment. We therefore need a device capable of taking measurements in situ.
The principle is to measure the directional hemispherical reflectance p” which allows to calculate the emissivity : ε=1-p”
Full band measurement (1-50μm) 8 to 14 μm or 3-5 μm optional
Measurement of total emissivity by reflectometric method. The modulated flux method allows the measurement of emissivity over a wide temperature range
For infrared radiation energy flux measurements, it is essential to know the emissivity value
The emissometer allows these users to :
- Measuring total directional emissivity
- Calculate the total hemispheric emissivity
- Possibility of measuring emissivity as a function of temperature, using a variable temperature source
The device can measure high and low emissivity.
Optionally, you can also measure emissivity in a specific
spectral band such as 8-14 μm, 3-5 μm or a custom band, specific to thermal cameras or other applications.
Supplied with power supply,
4 reference surfaces and carrying case
broadband (1-50μm), 3-5μm and 8-14μm integrating sphere
Possibility of geolocating measurements by GPS (optional)
Our team advises you to best meet your expectations