Realization of reflection measurements on different samples
Jean-Pierre Monchau, of the Themacs team, was at the 18th International Congress of Metrology, which was held at Paris Expo Porte de Versailles, from the 19th to the 21st September of 2017.
The CIM is an event bringing together 1000 participants from 50 countries, teachers and researchers, builders and decision makers, users and service providers from all fields and at all levels.
The objective of this congress is threefold:
- Improve the measurement, analysis and testing processes of the various stakeholders (while controlling risks);
- Monitor developments in measurement techniques, R&D advances and their practical applications;
- Find all the contacts in the sector on the same site for three days.
What was on the agenda? An exhibition of technological innovations and measurement professionals, conferences, round tables to exchange views, visits of some companies, and practical animations for moments of conviviality !
Jean-Pierre Monchau in the middle of explaining his poster
During this event, he presented a poster on thermal conductivity measurement of liquids by hot wire method, comparing stationary and transient regimes.
He also had the opportunity to interact with eminent colleagues and partners, with whom we hope to have the opportunity to interact afterwards!